Huygens STED Deconvolution Increases Signal-to-Noise and Image Resolution towards 22 nm
نویسندگان
چکیده
منابع مشابه
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ژورنال
عنوان ژورنال: Microscopy Today
سال: 2013
ISSN: 1551-9295,2150-3583
DOI: 10.1017/s1551929513001089